Optical constants and thickness determination of very thin amorphous semiconductor films
نویسندگان
چکیده
منابع مشابه
Optical constants and thickness determination of very thin amorphous semiconductor films
This contribution addresses the relevant question of retrieving, from transmittance data, the optical constants and thickness of very thin semiconductor and dielectric films. The retrieval process looks for a thickness that, subject to the physical input of the problem, minimizes the difference between the measured and the theoretical spectra. This is a highly underdetermined problem but, the u...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2002
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.1500785